V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques

TitleV1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques
Publication TypeConference Paper
Year of Publication2023
AuthorsWoo S, Choi E, Lee H, Oh H
Conference Name32nd USENIX Security Symposium (USENIX Security 23)
Date Published08/2023
PublisherUSENIX Association
Conference LocationAnaheim, CA
ISBN Number978-1-939133-37-3
URLhttps://www.usenix.org/conference/usenixsecurity23/presentation/woo