Dynamic Test Generation to Find Integer Bugs in x86 Binary Linux Programs

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Dynamic Test Generation to Find Integer Bugs in x86 Binary Linux Programs

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Authors:

David Molnar, Xue Cong Li, and David A. Wagner, University of California, Berkeley

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BibTeX

@inproceedings {182739,
title = {Dynamic Test Generation to Find Integer Bugs in x86 Binary Linux Programs},
booktitle = {18th USENIX Security Symposium (USENIX Security 09)},
year = {2009},
address = {Montreal, Quebec},
url = {https://www.usenix.org/conference/usenixsecurity09/technical-sessions/presentation/dynamic-test-generation-find-integer},
publisher = {USENIX Association},
month = aug
}

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