Authors:
Seung Won Yoo, Korea Advanced Institute of Science and Technology (KAIST); Joontaek Oh, University of Wisconsin–Madison; Myeongin Cheon and Bonmoo Koo, Korea Advanced Institute of Science and Technology (KAIST); Wonseb Jeong, Hyunsub Song, Hyeonho Song, and Donghun Lee, Samsung Electronics; Youjip Won, Korea Advanced Institute of Science and Technology (KAIST)
