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On the Non-Suitability of Non-Volatility
John Bent, EMC Corporation; Brad Settlemyer and Nathan DeBardeleben, Los Alamos National Laboratory; Sorin Faibish, Uday Gupta, Dennis Ting, and Percy Tzelnic, EMC Corporation
For many emerging and existing architectures, NAND flash is the storage media used to fill the cost-performance gap between DRAM and spinning disk. However, while NAND flash is the best of the available options, for many workloads its specific design choices and trade-offs are not wholly suitable. One such workload is long-running scientific applications which use checkpoint-restart for failure recovery. For these workloads, HPC data centers are deploying NAND flash as a storage acceleration tier, commonly called burst buffers, to provide high levels of write bandwidth for checkpoint storage. In this paper, we compare the costs of adding reliability to such a layer versus the benefits of not doing so. We find that, even though NAND flash is non-volatile, HPC burst buffers should not be reliable when the performance overhead of adding reliability is greater than 2%.
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author = {John Bent and Brad Settlemyer and Nathan DeBardeleben and Sorin Faibish and Dennis Ting and Uday Gupta and Percy Tzelnic},
title = {On the {Non-Suitability} of {Non-Volatility}},
booktitle = {7th USENIX Workshop on Hot Topics in Storage and File Systems (HotStorage 15)},
year = {2015},
address = {Santa Clara, CA},
url = {https://www.usenix.org/conference/hotstorage15/workshop-program/presentation/bent},
publisher = {USENIX Association},
month = jul
}
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